Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes: Honolulu Police Department - SIS, et al.

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Federal Register: December 8, 2009 (Volume 74, Number 234)

Notices

Page 64662-64663

From the Federal Register Online via GPO Access [wais.access.gpo.gov]

DOCID:fr08de09-19

DEPARTMENT OF COMMERCE

International Trade Administration

Honolulu Police Department - SIS, et al., Notice of Consolidated

Decision on Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the

Educational, Scientific, and Cultural Materials Importation Act of 1966

(Pub. L. 89-651, as amended by Pub. L. 106-36; 80

Page 64663

Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30

A.M. and 5:00 P.M. in Room 3705, U.S. Department of Commerce, 14th and

Constitution Avenue., NW, Washington, D.C.

Docket Number: 09-058. Applicant: Honolulu Police Department-SIS,

Honolulu, HI 96813. Instrument: Electron Microscope. Manufacturer: FEI

Company, Czech Republic. Intended Use: See notice at 74 FR 58001,

November 10, 2009.

Docket Number: 09-060. Applicant: University of California at San

Francisco, San Francisco, CA 94103. Instrument: Electron Microscope.

Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 74 FR 58001, November 10, 2009.

Docket Number: 09-061. Applicant: Argonne National Laboratory, Lemont,

IL 60439. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd.,

Japan. Intended Use: See notice at 74 FR 58001, November 10, 2009.

Docket Number: 09-062. Applicant: Department of Homeland Security,

Fredrick, MD 21702. Instrument: Electron Microscope. Manufacturer: FEI

Company, Czech Republic. Intended Use: See notice at 74 FR 58001,

November 10, 2009.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.

Dated: December 1, 2009.

Christopher Cassel,

Director, Subsidies Enforcement Office, Import Administration.

FR Doc. E9-29235 Filed 12-7-09; 8:45 am

BILLING CODE 3510-DS-S

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