Applications, hearings, determinations, etc.: Cornell University,

[Federal Register: September 21, 1998 (Volume 63, Number 182)]

[Notices]

[Page 50211]

From the Federal Register Online via GPO Access [wais.access.gpo.gov]

[DOCID:fr21se98-39]

DEPARTMENT OF COMMERCE

International Trade Administration

Cornell University; Notice of Decision on Application for Duty- Free Entry of Scientific Instrument

This decision is made pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89- 651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.

Docket Number: 98-035. Applicant: Cornell University, Ithaca, NY 14853. Instrument: Scanning Tunneling Microscope, Model JAFM-4500XT. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 63 FR 40473, July 29, 1998.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as it is intended to be used, is being manufactured in the United States. Reasons: The foreign instrument provides: (1) operation at temperatures to 500 deg.C and (2) measurement of the motion of the cantilever tip in the plane of the sample (frictional interaction). A domestic manufacturer of similar equipment advised August 28, 1998 that (1) these capabilities are pertinent to the applicant's intended purpose and (2) it knows of no domestic instrument or apparatus of equivalent scientific value to the foreign instrument for the applicant's intended use.

We know of no other instrument or apparatus of equivalent scientific value to the foreign instrument which is being manufactured in the United States. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff.

[FR Doc. 98-25114Filed9-18-98; 8:45 am]

BILLING CODE 3510-DS-P